Secondary Ion Mass Spectrometry
Applications for Depth Profiling and Surface Characterization
Format:Paperback
Publisher:Momentum Press
Published:15th Sep '15
Currently unavailable, and unfortunately no date known when it will be back

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
ISBN: 9781606505885
Dimensions: unknown
Weight: unknown
150 pages