Secondary Ion Mass Spectrometry

Applications for Depth Profiling and Surface Characterization

Fred Stevie author

Format:Paperback

Publisher:Momentum Press

Published:15th Sep '15

Currently unavailable, and unfortunately no date known when it will be back

Secondary Ion Mass Spectrometry cover

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

ISBN: 9781606505885

Dimensions: unknown

Weight: unknown

150 pages