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Deep Learning for Advanced X-ray Detection and Imaging Applications

Krzysztof Iniewski editor Liang Cai editor

Format:Hardback

Publisher:Springer International Publishing AG

Published:23rd Jan '25

Currently unavailable, and unfortunately no date known when it will be back

Deep Learning for Advanced X-ray Detection and Imaging Applications cover

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.

ISBN: 9783031756528

Dimensions: unknown

Weight: unknown

261 pages

2024 ed.