Silicon Carbide, Volume 1

Growth, Defects, and Novel Applications

Peter Friedrichs editor Gerhard Pensl editor Tsunenobu Kimoto editor Lothar Ley editor

Format:Hardback

Publisher:Wiley-VCH Verlag GmbH

Published:21st Oct '09

Currently unavailable, and unfortunately no date known when it will be back

Silicon Carbide, Volume 1 cover

This book prestigiously covers our current understanding of SiC as a semiconductor material in electronics. Its physical properties make it more promising for high-powered devices than silicon.

The volume is devoted to the material and covers methods of epitaxial and bulk growth. Identification and characterization of defects is discussed in detail. The contributions help the reader to develop a deeper understanding of defects by combining theoretical and experimental approaches.

Apart from applications in power electronics, sensors, and NEMS, SiC has recently gained new interest as a substrate material for the manufacture of controlled graphene. SiC and graphene research is oriented towards end markets and has high impact on areas of rapidly growing interest like electric vehicles.

The list of contributors reads like a "Who's Who" of the SiC community, strongly benefiting from collaborations between research institutions and enterprises active in SiC crystal growth and device development.

"At this stage, the two volumes provide an up-to-date, comprehensive, and critical assessment of all aspects of SiC semiconductor technology with an emphasis on power electronics . . . The contributions are written by internationally renowned experts from industry as well as academia who are actively involved in SiC R&D. Hence, the two volumes provide and evaluate source of information for everybody working with SiC or generally interested in the current and future state of power electronics". (Int. Journal of Microstructure and Materials Properties, 2011)

 

ISBN: 9783527409532

Dimensions: 231mm x 152mm x 15mm

Weight: 363g

528 pages