Response Data Compression Techniques in Digital Circuit Testing
Afaq Ahmad author Jaber Al-Balushi author
Format:Paperback
Publisher:LAP Lambert Academic Publishing
Published:11th Nov '14
Currently unavailable, and unfortunately no date known when it will be back
This paperback, "Response Data Compression Techniques in Digital Circuit Testing" from Afaq Ahmad & Jaber Al-Balushi, was published 11th November 2014 by LAP Lambert Academic Publishing.
ISBN: 9783659239618
Dimensions: 229mm x 152mm x 6mm
Weight: 150g
96 pages