Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance

Ming Xiao author

Format:Paperback

Publisher:VDM Verlag

Published:16th Dec '08

Currently unavailable, and unfortunately no date known when it will be back

Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance cover

This paperback, "Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance" from Ming Xiao, was published 16th December 2008 by VDM Verlag.

ISBN: 9783836493758

Dimensions: 229mm x 152mm x 7mm

Weight: 177g

124 pages