Pattern Analysis and Machine Intelligence

Second International Conference, ICPAMI 2025, Dalian, China, October 31 - November 2, 2025, Revised Selected Papers

Jie Yang editor Ran He editor Shiwei Ma editor

Format:Paperback

Publisher:Springer Verlag, Singapore

Published:2nd Jul '26

Currently unavailable, and unfortunately no date known when it will be back

Pattern Analysis and Machine Intelligence cover

This book constitutes the referred proceedings of the Second International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2025, held in Dalian, China, during August 29–31, 2025.

The 23 papers presented here were carefully reviewed and selected from 51 submissions. Their insightful talks covered the applications, challenges, and future directions of Multimodal Foundation and Large Language Models, the frontiers and perspectives in 3D Spatial Video Reconstruction, and research on defenses and out-of-distribution detection in trustworthy deep learning.

ISBN: 9789819595242

Dimensions: unknown

Weight: unknown

232 pages