Jan Verspecht Author

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011). Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE. Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements. Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.